Research focused on new materials is conceived as an independent whole that consists of physical and chemical laboratories. They are responsible for primary research in nano-technologies, properties of the technological basis for developing nano-structures, metering and diagnostics and application. The common thread between individual activities is the creation of mathematic-physical models, both in primary and applied research, and the application of supercomputer approaches for effectively solving these models:
- Developing nano-particle carriers that will target transport medicine to a specific place in the human body
- Developing new materials for the construction and engineering industries; for example, self-cleaning paint
- Research of magnetic properties of holograms with the aim to improve their protective function
- Research of nano-structures with plasma waves for sensors
RP4's project results to download:
This tool performes automatized calculation of interaction, cohesion, or adhesion energies between user defined parts of geometry optimized structures, or structures extracted from dynamics trajectories. Especially automatized treatment of large number of extracted structures significantly facilitates the analysis of simulation results. Tool may be utilized for analysis of long molecular dynamics trajectories needed for reliable study of interaction.
This set of scripts for MATLAB environment was created as a tool for determining the structural compatibility of two atomic planes (i.e. hkl planes, where hkl are Miller indices of given plane) of crystalline materials. Inputs include the coordinates of atoms in given planes, relevant distances between two atoms and size (area) of planes. Outputs are (a) visualization of overlap of two given atomic planes, (b) visualization of pairs of atoms in which the distance between atoms is equal or shorter than given relevant dostance, and (c) number of these atomic pairs. Input files containing the atomic coordinates can be created manually but the tool also allows you to calculate the coordinates of atoms in the plane rotated by a specific angle (together with automatic creation of input file with the newly calculated coordinates). Further, using this tool it is possible to determine the dependence of number of overlapping atoms on angle by which one atomic plane is rotated relative to the second one.
This tool is useful in study of nanocomposite structures containing crystalline components (nanoparticles on substrate, thin films on substrate, epitaxial growth).
This pack contains two m-files (mol_frag.m, MPRGP.m) for MATLAB environment and one illustration of input file (sample.txt).
Based on the results of elemental analysis of given real sample this tool is able to calculate the ratio of molecules or molecular fragments present in the sample. Also the charges (if we are dealing with ions) are taken into account. Software is useful in cases where it is necessary to determine the amount of impurities – especially the residues after preparation process. Direct determination of the ratio of molecules or their fragments is significantly helpful during the preparation of molecular models that are the most similar to real models but it can be also helpful for the interpretation of experimenatl data obtained from elemental analysis.
- Jaromír Pištora
Deputy head of research programme
- Gražyna Simha Martynková
- Jaroslav Vlček
- Pavla Čapková
- Jaroslav Hamrle
- Dominik Legut
- Kamil Postava
- Petr Široký
- Marta Valášková
- Jaroslav Vlček
- Dalibor Ciprian
- Karla Čech Barabaszová
- Marta Harničárová
- Aleš Hendrych
- Sylva Holešová
- Petr Jandačka
- František Staněk
- Jonáš Tokarský
- Eva Gryčová
- Radovan Grznárik
- Dominik Hlaváč
- Marianna Hundáková
- Jan Chochol
- Lucia Rozumová
- Magda Samlíková
- Jana Zdrálková
- Igor Hlubina
- Rostislav Pastrňák
VLČEK, J.; LESŇÁK, M.; PIŠTORA, J.; ŽIVOTSKÝ, O. Magneto-optical sensing of magnetic field. In Optics Communications. Volume 286, p. 372-377. Doi: http://dx.doi.org/10.1016/j.optcom.2012.08.059. 2013.
ZHANG, R. F.; LEGUT, D.; LIN, Z. J.; ZHAO, Y. S.; MAO, H. K.; VEPREK, S. Stability and Strength of Transition-Metal Tetraborides and Triborides. In Physical Review Letters. Volume 108, Issue 26, Article Number 255502. Doi: http://dx.doi.org/10.1103/PhysRevLett.108.255502. 2012.
POSTAVA, K.; HAMRLE, J.; HAMRLOVÁ, J.; HRABOVSKÝ, D.; ŽIVOTSKÝ, O.; PIŠTORA, J.; LUKÁŠ, D. Depth and material sensitivity in magneto-optic nanostructures. In Journal of Nanotechnologies. Volume 9, No.8/9, p. 784-808. Doi: http://dx.doi.org/10.1504/IJNT.2012.046753. 2012.
LEGUT, D.; PAVLŮ, J. Electronic structure and elasticity of Z-phases in the Cr-Nb-V-N system. In Journal of Physics. Volume 24, Number 195502. Doi: http://dx.doi.org/10.1088/0953-8984/24/19/195502. 2012.
VALÁŠKOVÁ, M.; MARTYNKOVÁ, G. S.; ZDRÁLKOVÁ, J.; VLČEK, J.; MATĚJKOVÁ, P. Cordierite composites reinforced with zircon arising from zirkonium-vermiculite precursor. In Materials Letters. Volume 80, p. 158-161. Doi: http://dx.doi.org/10.1016/j.matlet.2012.04.097. 2012.
KUSCHEL, T.; HAMRLE, J.; PIŠTORA, J.; SAITO, K.; BOSU, S.; SAKURABA, Y.; TAKANASHI, K.; WOLLSCHLÄGER, J. Magnetization reversal analysis of a thin B2-type ordered Co50Fe50 film by magnetooptic Kerr effect. In Journal of Physics. D: Applied Physics . Volume 45, No. 10, 205001. Doi: http://dx.doi.org/10.1088/0022-3727/45/20/205001. 2012.
HARNIČÁROVÁ, M.; VALÍČEK, J.; KUŠNEROVÁ, M.; GRZNÁRIK, R.; PETRŮ, J., Čepová L. A new Method for the Prediction of Laser Cut Surface Topography, Measurement. In Science Review, Volume 12, Issue 5, p. 195-204. Doi: http://dx.doi.org/10.2478/v10048-012-0030-9. 2012.
KUSCHEL, T.; HAMRLE, J.; PIŠTORA, J.; SAITO, K.; BOSU, S.; SAKURABA, Y.; TAKANASHI, K.; WOLLSCHLÄGER, J. Magnetic characterization of thin Co50Fe50 films by magnetooptic Kerr effect. In Journal of Physics. D: Apllied Physics. Volume 45, Issue 49, No. 10, 12 pp. Doi: http://dx.doi.org/10.1088/0022-3727/45/49/495002. 2012.
WATANABE, K.; PIŠTORA, J., NAKATAKE, Y. Rigorous coupled-wave analysis of electromagnetic scattering from lamellar grating with defects. In Optics Express. Volume 19 Issue 25, p. 25799-25812. Doi: http://dx.doi.org/10.1364/OE.19.025799. 2011.